Phonon exacerbated quantum interference effects in III-V nanowire transistors

被引:1
|
作者
Gilbert, M. J. [1 ]
Banerjee, S. K. [1 ]
机构
[1] Univ Texas Austin, Microelect Res Ctr, Austin, TX 78758 USA
关键词
MOSFET; Quantum wire; Transport; Simulation;
D O I
10.1007/s10825-006-0086-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years, a great deal of attention has been focused on the development of quantum wire transistors as a means of extending Moore's Law. Here we present, results of fully three-dimensional, self-consistent quantum mechanical device simulations of InAs tri-gate nanowire transistor (NWT). The effects of inelastic scattering have been included as real-space self-energy terms. We find that the position of dopant atoms in these devices can lead a reduction in the amount of scattering the carriers experience. We find that the combination of deeply buried dopant atoms and the high energy localization of polar optical phonon processes allow devices to recover their ballistic behavior even in the presence of strong inelastic phonon processes. However, we find that dopant atoms close to the source-channel interface cause severe quantum interference effects leading to significant performance reduction.
引用
收藏
页码:141 / 144
页数:4
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