Recent Tests of X-ray Spectrometers using Polycapillary optics

被引:4
|
作者
Heald, Steve [1 ]
Seidler, Gerald T. [2 ]
Mortensen, Devon [2 ]
Mattern, Brian [2 ]
Bradley, Joseph A. [3 ]
Hess, Nancy [4 ]
Bowden, Mark [4 ]
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[2] Univ Washington, Dept Phys, Seattle, WA 98195 USA
[3] Lawrence Livermore Natl Lab, Livermore, CA USA
[4] Pacific Northwest Natl Lab, Richland, WA USA
基金
加拿大自然科学与工程研究理事会;
关键词
Polycapillary; X-ray Spectroscopy; X-ray spectrometers; XAS; ELECTRONIC EXCITATIONS; CAPILLARY OPTICS; HIGH-PRESSURE; WAFERS;
D O I
10.1117/12.929960
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Polycapillary optics provide a promising approach for coupling highly-divergent x-ray emission or inelastic scattering to high-resolution crystal analyzers. We present recent results looking at the application of polycapillary collimators to emission spectrometers. The first application uses a collimating optic and a flat crystal to provide a tunable x-ray fluorescence detector. At high-flux synchrotron radiation sources there is sufficient flux (similar to 10(13) ph/sec) to allow application of X-ray Absorption Spectroscopy (XAS) to ppb concentrations if the fluorescence signal can be isolated from an intense background. The polycapillary based analyzer easily achieves the >10(6) background reduction needed for such measurements. It has the additional advantage of being confocal, only collecting the signal from a small volume at the optic focus, effectively eliminating background from sample substrates, windows, or air scattering. Second, the same type of analyzer can be used for higher-resolution emission spectroscopy if operated close to 90 degrees Bragg angle, and we report results of the commissioning of a user-available instrument suitable for few-eV resolution emission spectroscopy, including the demonstration of roughly order-of-magnitude improved measurement times compared to use of a traditional, single spherically-bent crystal analyzer. As part of this effort, we have developed a process for enhancing the integral reflectivity of Si analyzer crystals through plastic deformation at high temperatures.
引用
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页数:10
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