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- [21] A 1-Volt Temperature Sensor with Duty-Cycle-Modulated Output in 0.18 μm CMOS Technology 2015 23RD IRANIAN CONFERENCE ON ELECTRICAL ENGINEERING (ICEE), 2015, : 1089 - 1092
- [25] Degradation and Temperature Analysis of Voltage-Controlled Ring Oscillators for Robust and Reliable Oscillator Designs in a 65nm Bulk CMOS Process PROCEEDINGS OF THE 23RD INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (MIXDES 2016), 2016, : 353 - 358
- [26] Burn-in stress induced BTI degradation and post-burn-in High Temperature Anneal (Bake) effects in advanced HKMG and Oxynitride based CMOS Ring Oscillators 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012,