A low-cost BIST scheme for ADC testing

被引：0
|
作者：
Wang, YS [1 ]
Wang, JX [1 ]
Lai, FC [1 ]
Ye, YZ [1 ]
机构：
[1] Harbin Inst Technol, Ctr Microelect, Harbin 150001, Heilongjiang, Peoples R China
来源：
2005 6TH INTERNATIONAL CONFERENCE ON ASIC PROCEEDINGS, BOOKS 1 AND 2 | 2005年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A low-cost BIST scheme based on linear histogram for testing ADC is presented in this paper. A parallel time decomposition technique is presented to minimize not only hardware overhead but also testing time of the BIST scheme based on histogram. An area-efficient linear triangular waveform generator is discussed as test stimulus. The technique uses digital delta-sigma noise shaping to generate the on-chip precise analog stimulus and simplify the analog circuit of the generator at same time. A practical implementation is described and the performance is evaluated.
引用
收藏
页码：665 / 668
页数：4
相关论文
共 50 条
  • [41] A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling
    Chaganti, Shravan K.
    Xu, Li
    Chen, Degang
    2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2018,
  • [42] Analog devices targets low-cost ADC applications
    不详
    MICROWAVES & RF, 1996, 35 (10) : 25 - 25
  • [43] Low-cost Measurement of Frequency Stability Based on ADC
    Wang Lijuan
    Yao Zhendong
    Dai Xiaoxia
    PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOL. 3, 2008, : 1404 - 1407
  • [44] Scheme improves on low-cost keyboard
    O' Hara, M
    EDN, 2003, 48 (24) : 94 - 94
  • [45] Multi-Histogram ADC BIST System for ADC Linearity Testing
    Chan, Koay Soon
    Nordin, Nuzrul Fahmi
    Chan, Kim Chon
    Lok, Terk Zyou
    Yong, Chee Wai
    2013 22ND ASIAN TEST SYMPOSIUM (ATS), 2013, : 213 - 214
  • [46] A Low-Cost Programmable Memory BIST Design for Multiple Memory Instances
    Lin, Chung-Fu
    Huang, Chia-Fu
    Lu, De-Chung
    Hsu, Chih-Chiang
    Chiu, Wen-Tsung
    Chen, Yu-Wei
    Chang, Yeong-Jar
    2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 1047 - 1047
  • [47] Generic, Orthogonal and Low-cost March Element based Memory BIST
    van de Goor, Ad J.
    Hamdioui, Said
    Kukner, Halil
    2011 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2011,
  • [48] Low Cost BIST Scheme Using LFSR-RC Reseeding
    Bin Zhou
    Mingxue Huo
    Xinchun Wu
    Journal of Harbin Institute of Technology, 2015, 22 (03) : 57 - 62
  • [49] VERSATILE LOW-COST TESTING MACHINE
    不详
    METALLURGIA AND METAL FORMING, 1975, 42 (11): : 387 - 388
  • [50] LOW-COST DYNAMIC TENSILE TESTING
    SCHINDLER, HJ
    VEIDT, M
    JOURNAL DE PHYSIQUE IV, 1994, 4 (C8): : 135 - 140
12345