Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy

被引：26
|
作者：
Huntington, ST
Nugent, KA
Roberts, A
Mulvaney, P
Lo, KM
机构：
[1] UNIV MELBOURNE,SCH PHYS,PARKVILLE,VIC 3052,AUSTRALIA
[2] UNIV MELBOURNE,SCH CHEM,PARKVILLE,VIC 3052,AUSTRALIA
[3] UNIV HONG KONG,DEPT ELECT & ELECT ENGN,HONG KONG,HONG KONG
来源：
JOURNAL OF APPLIED PHYSICS | 1997年 / 82卷 / 02期
关键词：
D O I：
10.1063/1.365608
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Scanning near-field optical microscopy is used to measure the mode profile and evanescent field of a Ge-doped D-shaped optical fiber. The structure of the fiber is determined by differential etching followed by an investigation of the resultant topography with an atomic force microscope. This information is then used to theoretically model the expected behavior of the fiber and it is shown that the theoretical results are in excellent agreement with the experimentally observed field. (C) 1997 American Institute of Physics.
引用
收藏
页码：510 / 513
页数：4
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