Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy

被引：0
|
作者：
Borrisé, Xavier [1 ]
Jiménez, David [1 ]
Pérez-Murano, Francesc [1 ]
Llobera, Andreu [2 ]
Domínguez, Carlos [2 ]
Barniol, Núria [1 ]
机构：
[1] Dept. of Electronics Engineering, Edifici Cn, Univ. Autónoma de Barcelona, E-08193 Bellaterra, Spain
[2] Natl. Ctr. Microelectron. (IMB-CSIC), Camp. Univ. Auton. de Barcelona, E-08193 Bellaterra, Spain
来源：
Journal of the Optical Society of America A: Optics and Image Science, and Vision | 2000年 / 17卷 / 12期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
13
引用
收藏
页码：2243 / 2248
相关论文
共 50 条
  • [1] Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy
    Borrisé, X
    Jiménez, D
    Pérez-Murano, F
    Llobera, A
    Domínguez, C
    Barniol, N
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2000, 17 (12): : 2243 - 2248
  • [2] Characterization of materials and devices by near-field scanning optical microscopy
    Goldberg, BB
    Ghaemi, HF
    Unlu, MS
    Herzog, WD
    DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II, 1996, 406 : 171 - 182
  • [3] Hybrid control method of near-field scanning optical microscope for characterization of optical waveguide devices
    Ji, WS
    Jang, SJ
    Beom-hoan, O
    Park, SG
    Lee, EH
    Lee, SG
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2005, 47 : S217 - S221
  • [4] Scanning near-field optical microscopy as a tool for the characterization of multimode interference devices
    Martin, MJ
    Benyattou, T
    Orobtchouk, R
    Rooms, F
    Morand, A
    Schanen, I
    Benech, P
    APPLIED OPTICS, 2005, 44 (13) : 2558 - 2563
  • [5] Optical characterization of nanosources used in scanning near-field optical microscopy
    Univ de Franche-Comte, Besancon, France
    Journal of the Optical Society of America A: Optics and Image Science, and Vision, 1995, 12 (04): : 695 - 703
  • [6] CHARACTERIZATION OF OPTICAL FIBERS USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    BUTLER, DJ
    NUGENT, KA
    ROBERTS, A
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (06) : 2753 - 2756
  • [7] OPTICAL CHARACTERIZATION OF NANOSOURCES USED IN SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    VANLABEKE, D
    BARCHIESI, D
    BAIDA, F
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (04): : 695 - 703
  • [8] Scanning near-field optical microscopy analyses of electronic devices
    Cramer, RM
    Schade, WR
    Heiderhoff, R
    Balk, LJ
    Chin, R
    MICROELECTRONICS AND RELIABILITY, 1998, 38 (6-8): : 963 - 968
  • [9] Near-field scanning optical microscopy studies of materials and devices
    Hsu, JWP
    MRS BULLETIN, 1997, 22 (08) : 27 - 30
  • [10] Near-Field Scanning Optical Microscopy Studies of Materials and Devices
    J. W. P. Hsu
    MRS Bulletin, 1997, 22 : 27 - 30
12345