Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy

被引：0
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作者：
Borrisé, Xavier [1 ]
Jiménez, David [1 ]
Pérez-Murano, Francesc [1 ]
Llobera, Andreu [2 ]
Domínguez, Carlos [2 ]
Barniol, Núria [1 ]
机构：
[1] Dept. of Electronics Engineering, Edifici Cn, Univ. Autónoma de Barcelona, E-08193 Bellaterra, Spain
[2] Natl. Ctr. Microelectron. (IMB-CSIC), Camp. Univ. Auton. de Barcelona, E-08193 Bellaterra, Spain
来源：
Journal of the Optical Society of America A: Optics and Image Science, and Vision | 2000年 / 17卷 / 12期
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摘要：
13
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页码：2243 / 2248
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