Thermodynamic study on the corrosion mechanism of copper wire bonding

被引:31
|
作者
Zeng, Yingzhi [1 ]
Bai, Kewu [1 ]
Jin, Hongmei [1 ]
机构
[1] Inst High Performance Comp, Singapore 138632, Singapore
关键词
POINT-DEFECT MODEL; ALUMINUM; BREAKDOWN; RELIABILITY; PASSIVITY; DIAGRAMS; BEHAVIOR; ALLOYS; SYSTEM;
D O I
10.1016/j.microrel.2013.03.006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to achieve longer life reliability of copper bonding, it is crucial to understand the corrosion mechanism of copper wire bonding under humid environments. Although it has been revealed that the formation of Al-Cu intermetallic compound (IMC) dominates the bond reliability, the mechanism remains unclear despite considerable efforts by experiments. While Pourbaix (Eh-pH) diagrams have long been used to study the corrosion mechanism of pure metals, the alloy Eh-pH diagrams are still lacking. In this work, by assessing various thermodynamic data of Cu-Al-Cl-H2O system, we construct the Pourbaix diagrams associated with Cu bonding involving IMCs and study the corrosion behaviors under various environmental parameters such as temperatures and chloride concentrations. We further rationalize the corrosion kinetics of various Al-metal IMCs on the basis of the cation transport model via the calculation of the chemical potentials of aluminum in IMCs. Our study suggests a guideline to enhance bonding corrosion resistance, i.e., improving the thermal stability of IMCs and suppressing the Al vacancy diffusion in Al2O3 layer by doping highly charged element(s) in Al pad. The results yield greater insight into the corrosion mechanism which may lead to improving reliability in Cu bonding. (c) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:985 / 1001
页数:17
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