Enhancing bondability with coated copper bonding wire

被引:42
|
作者
Uno, Tomohiro [1 ]
机构
[1] Nippon Steel Corp Ltd, Adv Tech Res Labs, Osaka, Japan
关键词
D O I
10.1016/j.microrel.2010.04.014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There is growing interest in Cu wire bonding for LSI interconnection due to the cost savings and better electrical and mechanical properties. However, the scope of use for Cu bonding wires is generally severely limited compared to Au wires; e.g. for wire oxidation, lower bondability, forming gas of N-2 + 5%H-2, and lower reliability. It is difficult for conventional bare Cu wires to achieve the target of LSI application. A coated Cu wire (EX1) has thus been developed. It is a Pd-coated Cu wire and has many advantages compared to bare Cu wires. Its stitch strength was far superior under fresh conditions and remained constant without any deterioration after being stored in air for a prolonged period. EX1 had a lifetime of over 90 days in air, as compared to just 7 days for bare Cu wire. Spherical balls were formed with pure N-2 (hydrogen-free), whereas the bare Cu produced off-center balls. Finally, the cost-effective and secure gas, pure N-2 was only available for EX1. The excellent performance of the EX1 coated Cu wire is comparable to that of Au wires, making it suitable for LSI packaging. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:88 / 96
页数:9
相关论文
共 50 条
  • [1] Novel Coated Silver (Ag) Bonding Wire: Bondability and Reliability
    Kumar, Balasubramanian Senthil
    Murali, Sarangapani
    Tae, Kang Il
    Evonne, Lim Yee Weon
    Wei, Tok Chee
    James, Kim Tae Yeop
    Eric, Tan Swee Seng
    Xi, Zhang
    2017 IEEE 19TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2017,
  • [2] Wire bonding - what is bondability?
    Berchtold, L.
    Galvanotechnik, 1998, 89 (08): : 2738 - 2744
  • [3] Evaluation of bondability and reliability of single crystal copper wire bonding
    Chen, Hua
    Lee, S. W. Ricky
    Ding, Yutian
    Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05), 2005, : 238 - 244
  • [4] Wire Bonding of Cu and Pd Coated Cu Wire: Bondability, Reliability, and IMC Formation
    Qin, Ivy
    Xu, Hui
    Clauberg, Horst
    Cathcart, Ray
    Acoff, Viola L.
    Chylak, Bob
    Huynh, Cuong
    2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2011, : 1489 - 1495
  • [5] Wire bonding of Au-coated Ag wire: bondwire properties, bondability and IMCs formation
    Tseng, Yi Wei
    Hung, Fei-Yi
    Lui, Truan-Sheng
    2015 EUROPEAN MICROELECTRONICS PACKAGING CONFERENCE (EMPC), 2015,
  • [7] Bondability window and power input for wire bonding
    Han, L
    Wang, FL
    Xu, WH
    Zhong, J
    MICROELECTRONICS RELIABILITY, 2006, 46 (2-4) : 610 - 615
  • [8] The Role of Friction Coefficient on the Stitch Bondability in Pd Coated Cu and Bare Cu Wire Bonding
    Rezvani, A.
    Nan, C.
    Mayer, M.
    Qin, I.
    2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 2150 - 2156
  • [9] Effects of bonding frequency on Au wedge wire bondability
    Yu Hin Chan
    Jang-Kyo Kim
    Deming Liu
    Peter C. K. Liu
    Yiu Ming Cheung
    Ming Wai Ng
    Journal of Materials Science: Materials in Electronics, 2008, 19 : 281 - 288
  • [10] Effects of bonding frequency on Au wedge wire bondability
    Chan, Yu Hin
    Kim, Jang-Kyo
    Liu, Deming
    Liu, Peter C. K.
    Cheung, Yiu Ming
    Ng, Ming Wai
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (03) : 281 - 288