共 50 条
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- [2] How can the results of silicon debug justify the investment in Design-for-Debug Infrastructure? 2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2007, : 1030 - 1030
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- [4] SOC and multicore debug: Are design for debug (DFD) features that are put in re-use cores sufficient for silicon debug? 2006 IEEE International Test Conference, Vols 1 and 2, 2006, : 1083 - 1083
- [5] Silicon symptoms to solutions: Applying design for debug techniques INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 664 - 672
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- [7] SOC and Multi-Core Debug: Are Design for Debug (DFD) features that are put in reuse cores sufficient for Silicon Debug? 2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2006, : 1084 - 1084
- [8] Are design for debug (DFD) features that are put in reuse cores sufficient for silicon debug? position statement 2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2006, : 1082 - 1082
- [10] Scan Based Silicon Debug CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2012 (CSTIC 2012), 2012, 44 (01): : 1021 - 1027