Experimental and Simulation Study of Double-Sided Flip-Chip Assembly With a Stiffener Ring

被引:11
|
作者
Liu, Xi [1 ]
Li, Ming [2 ]
Mullen, Donald R. [2 ]
Cline, Julia [2 ]
Sitaraman, Suresh K. [1 ]
机构
[1] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Comp Aided Simulat Packaging Reliabil Lab CASPaR, Atlanta, GA 30332 USA
[2] Rambus Inc, Sunnyvale, CA 94089 USA
关键词
Assembly; double-sided flip-chip; electronic packaging; finite-element modeling; warpage;
D O I
10.1109/TDMR.2013.2283062
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The microelectronic packaging field is moving into the third dimension for miniaturization, low power consumption, and better performance. In this paper, we present a double-sided flip-chip (FC) organic substrate with a memory controller on one side of the package and 3-D stacked disaggregated memory chips on the other side of the package. This design allows the controller to interface with the DRAM stack directly through the substrate providing the shortest possible interconnect path and thus achieving the fastest signaling speed. However, this double-sided FC configuration also causes yield, assembly, test, and reliability challenges. In order to optimize the assembly process, elastic and viscoelastic sequential 3-D finite-element models are developed to simulate the package assembly process and are validated experimentally. In these simulations, various assembly process sequences are simulated with different conditions.
引用
收藏
页码:512 / 522
页数:11
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