Thermal Measurement Techniques in Analytical Microfluidic Devices

被引:6
|
作者
Davaji, Benyamin [1 ]
Lee, Chung Hoon [1 ]
机构
[1] Marquette Univ, Nanoscale Devices Lab, Milwaukee, WI 53233 USA
来源
基金
美国国家科学基金会;
关键词
Engineering; Issue; 100; Thermal Particle Detection; Thermal Wave Analysis; Heat Penetration Time; Thermal Time Constant; Enthalpy Assay; Thermal Conductivity and Specific Heat;
D O I
10.3791/52828
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Thermal measurement techniques have been used for many applications such as thermal characterization of materials and chemical reaction detection. Micromachining techniques allow reduction of the thermal mass of fabricated structures and introduce the possibility to perform high sensitivity thermal measurements in the micro-scale and nano-scale devices. Combining thermal measurement techniques with microfluidic devices allows performing different analytical measurements with low sample consumption and reduced measurement time by integrating the miniaturized system on a single chip. The procedures of thermal measurement techniques for particle detection, material characterization, and chemical detection are introduced in this paper.
引用
收藏
页数:9
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