X-ray optics for mu eV-resolved spectroscopy

被引：30
|
作者：
Rohlsberger, R
Gerdau, E
Ruffer, R
Sturhahn, W
Toellner, TS
Chumakov, AI
Alp, EE
机构：
[1] ARGONNE NATL LAB,ADV PHOTON SOURCE,ARGONNE,IL 60439
[2] INST EXPT PHYS 2,D-22761 HAMBURG,GERMANY
[3] EUROPEAN SYNCHROTRON RADIAT FACIL,F-38043 GRENOBLE,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1997年 / 394卷 / 1-2期
基金：
美国能源部;
关键词：
D O I：
10.1016/S0168-9002(97)00710-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A new spectroscopic technique is introduced that allows tuning of a mu eV-wide beam of synchrotron radiation over a range of a few meV. It relies on nuclear resonant scattering in combination with a polarization filtering technique. The spectrometer consists of a crystal polarizer/analyzer pair in crossed setting with a grazing incidence reflection from a Fe-57-coated rotating mirror in between that acts as Doppler shifter. The demonstrated features of the new technique lay a base for mu eV-resolved inelastic X-ray spectroscopy.
引用
收藏
页码：251 / 255
页数：5
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