X-ray optics for mu eV-resolved spectroscopy

被引：30

作者：

Rohlsberger, R

Gerdau, E

Ruffer, R

Sturhahn, W

Toellner, TS

Chumakov, AI

Alp, EE

机构：

[1] ARGONNE NATL LAB,ADV PHOTON SOURCE,ARGONNE,IL 60439

[2] INST EXPT PHYS 2,D-22761 HAMBURG,GERMANY

[3] EUROPEAN SYNCHROTRON RADIAT FACIL,F-38043 GRENOBLE,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1997年 / 394卷 / 1-2期

基金：

美国能源部;

关键词：

D O I：

10.1016/S0168-9002(97)00710-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new spectroscopic technique is introduced that allows tuning of a mu eV-wide beam of synchrotron radiation over a range of a few meV. It relies on nuclear resonant scattering in combination with a polarization filtering technique. The spectrometer consists of a crystal polarizer/analyzer pair in crossed setting with a grazing incidence reflection from a Fe-57-coated rotating mirror in between that acts as Doppler shifter. The demonstrated features of the new technique lay a base for mu eV-resolved inelastic X-ray spectroscopy.

引用

页码：251 / 255

页数：5

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