Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments

被引：0

作者：

Valdivia, M. P. ^{[1
]}

Stutman, D. ^{[1
]}

Stoeckl, C. ^{[2
]}

Mileham, C. ^{[2
]}

Begishev, I. A. ^{[2
]}

Theobald, W. ^{[2
]}

Bromage, J. ^{[2
]}

Regan, S. P. ^{[2
]}

Klein, S. R. ^{[3
]}

Munoz-Cordovez, G. ^{[4
]}

Vescovi, M. ^{[4
]}

Valenzuela-Villaseca, V. ^{[4
]}

Veloso, F. ^{[4
]}

机构：

[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA

[2] Univ Rochester, Laser Energet Lab, 250 E River Rd, Rochester, NY 14623 USA

[3] Univ Michigan, Ctr Laser Expt Astrophys Res, Ann Arbor, MI 48105 USA

[4] Pontificia Univ Catolica Chile, Inst Fis, Santiago, Chile

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 11期

关键词：

Compendex;

D O I：

10.1063/1.4959158

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moire image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, similar to 1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas. Published by AIP Publishing.

引用

页数：6

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