Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments

被引：0
|
作者：
Valdivia, M. P. [1 ]
Stutman, D. [1 ]
Stoeckl, C. [2 ]
Mileham, C. [2 ]
Begishev, I. A. [2 ]
Theobald, W. [2 ]
Bromage, J. [2 ]
Regan, S. P. [2 ]
Klein, S. R. [3 ]
Munoz-Cordovez, G. [4 ]
Vescovi, M. [4 ]
Valenzuela-Villaseca, V. [4 ]
Veloso, F. [4 ]
机构：
[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA
[2] Univ Rochester, Laser Energet Lab, 250 E River Rd, Rochester, NY 14623 USA
[3] Univ Michigan, Ctr Laser Expt Astrophys Res, Ann Arbor, MI 48105 USA
[4] Pontificia Univ Catolica Chile, Inst Fis, Santiago, Chile
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 11期
关键词：
Compendex;
D O I：
10.1063/1.4959158
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moire image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, similar to 1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas. Published by AIP Publishing.
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页数：6
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