Low-power and high-speed SRAM cells for double-node-upset recovery

This paper presents radiation hardened SRAM (namely LPDNUR and HSDNUR), both of which can self-recover from single-node and double-node upsets. LPDNUR uses a two-input C-element structure, which reduces the average power consumption because the stacked effect. Moreover, in order to reduce read access time (RAT) and write access time (WAT), the paper proposes HSDNUR, which uses a combination of NMOS and PMOS as the transistor for one-node data transmission, an approach that increases the current drive capability and reduces transmission delays. Compared to the state-of-the-art radiation-hardened SRAM design, such as QUCCE10T, QUCCE12T, We-Quatro, etc. The model results show that the average power consumption of LPDNUR is reduced by 24.59% on average, and the RAT and WAT of HSDNUR are reduced by an average of 35.71% and 24.14% respectively.