Effects of Shock Waves on Shack-Hartmann Wavefront Sensor Data

被引:10
|
作者
Kalensky, Matthew [1 ]
Kemnetz, Matthew R. [2 ]
Spencer, Mark F. [3 ]
机构
[1] Naval Surface Warfare Ctr Dahlgren Div, Integrated Engagement Syst Dept, Dahlgren, VA 22448 USA
[2] Air Force Res Lab, Directed Energy Directorate, Kirtland AFB, NM 87117 USA
[3] Air Force Inst Technol, Dept Engn Phys, Opt Sci & Engn, Wright Patterson AFB, OH 45433 USA
关键词
AEROOPTICAL ENVIRONMENT; FLOW; HEMISPHERE; SIMULATION; TURRETS;
D O I
10.2514/1.J062783
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Shock waves will form by turning supersonic or locally supersonic flow and result in an increase in the freestream density downstream of the shock. This increase leads to optical distortions that limit the effectiveness of aircraft mounted laser systems. In this paper, analytic expressions are developed to describe these optical distortions in terms of the optical-path difference (OPD). Pupil-plane disturbances imposed by the shock are studied for two cases: when the shock is parallel to the propagation direction and when the shock is on an angle relative to the propagation direction. Upon propagation from the pupil plane, the analysis shows that shock-induced phase discontinuities can sometimes cause the irradiance pattern in the image plane to bifurcate. Despite a large amount of tilt in the pupil plane, the bifurcated irradiance pattern does not map to a proportional shift in the image plane. The implications that these findings have on Shack-Hartmann wavefront sensor (SHWFS) data are also explored. The results show that least-squares reconstruction from the SHWFS data yield accurate estimates of the change in OPD across the shock when the magnitude of the phase difference delta phi caused by the shock is between 0 and approximately 0.5 pi [rad]. However, when vertical bar &Delta phi vertical bar > 0.5 pi [rad], the results show that least-squares reconstruction begins to severely underestimate the change in OPD across the shock. Such results will inform future efforts looking to develop aircraft-mounted laser systems.
引用
收藏
页码:2356 / 2368
页数:13
相关论文
共 50 条
  • [21] Detecting error of Shack-Hartmann wavefront sensor
    Jiang, WH
    Xian, H
    Shen, F
    ADAPTIVE OPTICS AND APPLICATIONS, 1997, 3126 : 534 - 544
  • [22] CUMULATIVE WAVEFRONT RECONSTRUCTOR FOR THE SHACK-HARTMANN SENSOR
    Zhariy, Mariya
    Neubauer, Andreas
    Rosensteiner, Matthias
    Ramlau, Ronny
    INVERSE PROBLEMS AND IMAGING, 2011, 5 (04) : 893 - 913
  • [23] Wavefront reconstruction with the adaptive Shack-Hartmann sensor
    Seifert, L
    Tiziani, HJ
    Osten, W
    OPTICS COMMUNICATIONS, 2005, 245 (1-6) : 255 - 269
  • [24] Measurement error of wavefront phase with Shack-Hartmann wavefront sensor
    Shen, Feng
    Jiang, Wenhan
    Guangxue Xuebao/Acta Optica Sinica, 2000, 20 (05): : 666 - 671
  • [25] Shack-Hartmann wavefront sensor optical dynamic range
    Akondi, Vyas
    Dubra, Alfredo
    OPTICS EXPRESS, 2021, 29 (06) : 8417 - 8429
  • [26] Shock-wave tolerant phase reconstruction algorithm for Shack-Hartmann wavefront sensor data
    DeFoor, Thomas E.
    Kalensky, Matthew
    Kemnetz, Matthew R.
    Bukowski, Timothy J.
    Spencer, Mark F.
    OPTICAL ENGINEERING, 2023, 62 (12)
  • [27] Optimization for high precision Shack-Hartmann wavefront sensor
    Li, Chao
    Xia, Mingliang
    Liu, Zhaonan
    Li, Dayu
    Xuan, Li
    OPTICS COMMUNICATIONS, 2009, 282 (22) : 4333 - 4338
  • [28] Wavefront reconstruction algorithms for the adaptive Shack-Hartmann sensor
    Seifert, L
    Tiziani, HJ
    Osten, W
    Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 : 544 - 553
  • [29] Improved wavefront reconstruction for Shack-Hartmann wavefront sensor in the presence of shock-related distortions
    Chu, Ethan D.
    Bukowski, Timothy J.
    Gordeyev, Stanislav
    OPTICS AND LASER TECHNOLOGY, 2025, 187
  • [30] Shack-Hartmann wavefront sensor for beam quality measurements
    Kudryashov, AV
    Panchenko, VY
    Zavalova, VY
    SEVENTH INTERNATIONAL SYMPOSIUM ON LASER METROLOGY APPLIED TO SCIENCE, INDUSTRY, AND EVERYDAY LIFE, PTS 1 AND 2, 2002, 4900 : 331 - 338