Cationization of organic molecules under keV and MeV primary ion bombardment

被引:2
|
作者
Jencic, Bostjan [1 ]
Ekar, Jernej [1 ,2 ]
Vasic, Mirjana [1 ,2 ]
Barba, Ziga [1 ]
Kelemen, Mitja [1 ]
Vavpetic, Primoz [1 ]
Kovac, Janez [1 ]
Pelicon, Primoz [1 ]
机构
[1] Jozef Stefan Inst, Jamova 39, SI-1000 Ljubljana, Slovenia
[2] Jozef Stefan Postgrad Sch, Jamova 39, SI-1000 Ljubljana, Slovenia
关键词
MeV-SIMS; Secondary ion mass spectrometry; Cationization; Sputtering; Time-of-flight mass spectrometry; Imaging mass spectrometry; MASS-SPECTROMETRY; POLYETHYLENE-GLYCOL; YIELD ENHANCEMENT; ENERGY; TIME; SIMS; FRAGMENTATION; DEPENDENCE; ARGON; BEAM;
D O I
10.1016/j.ijms.2022.116983
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
The present work reports on cationization characteristics of organic molecules in alkali metal environ-ment. Samples of arginine and polyethylene glycol polymers with average masses of 600, 1000 and 1500 were mixed with sodium-and potassium trifluoroacetate of various concentrations, and analyzed through secondary ion mass spectrometry. Bombardment proceeded with ions within both keV and MeV energy domains. Added salts positively affected the secondary ion yield through attachment of Na or K to organic molecule. Ionization differences between swift (MeV) ions and cluster ions, commonly used for secondary ion mass spectrometry analysis, were studied for arginine and PEG 600. While for arginine, secondary ion yield enhancement was only by a factor of 2, when analysing with MeV ions, and no enhancement was observed with keV Bi3 clusters, all polyethylene glycol samples showed increase of the secondary ion yield by factors between 3 and 40, depending on the amount of potassium or sodium that was mixed into the matrix. Additionally, higher amounts of salts also resulted in decreased fragmen-tation probability for organic molecules, reducing the intensities of specific fragments by more than two orders of magnitude.(c) 2022 Elsevier B.V. All rights reserved.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] Secondary ion emission from silicon under 8 keV O-2(+) and Ar+ ion bombardment
    Huan, CH
    Wee, ATS
    Low, HSM
    Tan, KL
    VACUUM, 1996, 47 (02) : 119 - 127
  • [42] MOLECULAR-MOTION INDUCED BY KEV ION-BOMBARDMENT
    GARRISON, BJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1986, 191 : 102 - COLL
  • [43] Energy spectra of sputtered species under sub-keV ion bombardment: experiments and computer simulations
    Mousel, T
    Eckstein, W
    Gnaser, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 152 (01): : 36 - 48
  • [44] ON THE ORIGIN OF FAST ELECTRONS IN KEV ION-SOLID BOMBARDMENT
    BURGHARDT, B
    VICANEK, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 101 (03): : 303 - 305
  • [45] CHEMICAL EVOLUTION OF FROZEN METHANE BY KEV ION-BOMBARDMENT
    FOTI, G
    CALCAGNO, L
    ZHOU, FZ
    STRAZZULLA, G
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 24-5 : 522 - 525
  • [47] Energy spectra of sputtered species under sub-keV ion bombardment: Experiments and computer simulations
    Fb. Physik Inst. Oberflachen- S., Univ. Kaiserslautern, D-67663, Kaiserslautern, Germany
    不详
    Nucl Instrum Methods Phys Res Sect B, 1 (36-48):
  • [48] MOLECULAR-DYNAMICS SIMULATION OF ADATOM FORMATION UNDER KEV-ION BOMBARDMENT OF PT(111)
    GADES, H
    URBASSEK, HM
    PHYSICAL REVIEW B, 1994, 50 (15): : 11167 - 11174
  • [49] Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment
    Delcorte, A
    Bertrand, P
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1999, 184 (2-3) : 217 - 231
  • [50] PRODUCTION MEV ION IMPLANTERS FOR ENERGIES FROM 200 KEV TO 4 MEV
    RATHMELL, RD
    NORTON, GA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 21 (2-4): : 270 - 273