Scanning transmission ion microscopy on Fudan SPM facility

In this paper,we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy(SPM) facility.By using Si-PIN diode(Hamamatsu S1223-01) detector,scanning transmission ion microscopy(STIM) measurement system has been set up.It can provide density and structural images with high probing efficiency and non-destruction by utilizing the energy loss of high energy(MeV) and focused ions penetrating through a thin sample.STIM measurement is able to map the density distribution of organic elements which mostly compose biology materials,such information can not be detected by using conventional Be-windowed Si(Li) X-ray detector in Particle Induced X-ray Emission(PIXE) technique.The spatial resolution capability of STIM is higher than PIXE technique at same accelerator status.As a result of STIM measurement,Paramecium attached on the top of Kapton tube was measured by STIM.