Scanning transmission ion microscopy on Fudan SPM facility

被引：0
|
作者：
SATOH Takahiro [1 ]
机构：
[1] Takasaki Advanced Radiation Research Institute,Japan Atomic Energy Agency,1233 Watanuki-machi,Takasaki,Gunma 370-1292,Japan
来源：
Nuclear Science and Techniques | 2011年 / 22卷 / 05期
关键词：
Energy loss; STIM; PIXE; Spatial resolution; Computed tomography;
D O I：
10.13538/j.1001-8042/nst.22.282-286
中图分类号：
TH742 [显微镜];
学科分类号：
0803 ;
摘要：
In this paper,we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy(SPM) facility.By using Si-PIN diode(Hamamatsu S1223-01) detector,scanning transmission ion microscopy(STIM) measurement system has been set up.It can provide density and structural images with high probing efficiency and non-destruction by utilizing the energy loss of high energy(MeV) and focused ions penetrating through a thin sample.STIM measurement is able to map the density distribution of organic elements which mostly compose biology materials,such information can not be detected by using conventional Be-windowed Si(Li) X-ray detector in Particle Induced X-ray Emission(PIXE) technique.The spatial resolution capability of STIM is higher than PIXE technique at same accelerator status.As a result of STIM measurement,Paramecium attached on the top of Kapton tube was measured by STIM.
引用
收藏
页码：282 / 286
页数：5
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