Scanning transmission ion microscopy on Fudan SPM facility

被引：0
|
作者：
SATOH Takahiro [1 ]
机构：
[1] Takasaki Advanced Radiation Research Institute,Japan Atomic Energy Agency,1233 Watanuki-machi,Takasaki,Gunma 370-1292,Japan
来源：
Nuclear Science and Techniques | 2011年 / 22卷 / 05期
关键词：
Energy loss; STIM; PIXE; Spatial resolution; Computed tomography;
D O I：
10.13538/j.1001-8042/nst.22.282-286
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
In this paper,we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy(SPM) facility.By using Si-PIN diode(Hamamatsu S1223-01) detector,scanning transmission ion microscopy(STIM) measurement system has been set up.It can provide density and structural images with high probing efficiency and non-destruction by utilizing the energy loss of high energy(MeV) and focused ions penetrating through a thin sample.STIM measurement is able to map the density distribution of organic elements which mostly compose biology materials,such information can not be detected by using conventional Be-windowed Si(Li) X-ray detector in Particle Induced X-ray Emission(PIXE) technique.The spatial resolution capability of STIM is higher than PIXE technique at same accelerator status.As a result of STIM measurement,Paramecium attached on the top of Kapton tube was measured by STIM.
引用
收藏
页码：282 / 286
页数：5
相关论文
共 50 条
  • [1] Scanning transmission ion microscopy on Fudan SPM facility
    Li Yongqiang
    Satoh, Takahiro
    Shen Hao
    Zheng Yi
    Li Xinyi
    Liu Bo
    NUCLEAR SCIENCE AND TECHNIQUES, 2011, 22 (05) : 282 - 286
  • [2] Development of scanning transmission ion microscopy computed tomography at Fudan microbeam line
    LI Yongqiang
    HABCHI Claire
    LIU Xue
    LIU Yiyang
    SHEN Hao
    Nuclear Science and Techniques, 2013, 24 (04) : 7 - 10
  • [3] Development of scanning transmission ion microscopy computed tomography at Fudan microbeam line
    Li Yongqiang
    Habchi, Claire
    Liu Xue
    Liu Yiyang
    Shen Hao
    NUCLEAR SCIENCE AND TECHNIQUES, 2013, 24 (04)
  • [4] Sensors for scanning probe microscopy (SPM)
    Oesterschulze, E
    Kassing, R
    MICRO MATERIALS, PROCEEDINGS, 2000, : 335 - 335
  • [5] Sensors for scanning probe microscopy (SPM)
    Oesterschulze, E
    Rangelow, I
    Kassing, R
    PROCEEDING OF THE TENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOLS I AND II, 2000, 3975 : 683 - 690
  • [6] APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY
    BREESE, MBH
    LANDSBERG, JP
    KING, PJC
    GRIME, GW
    WATT, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 64 (1-4): : 505 - 511
  • [7] Scanning transmission ion microscopy of polycarbonate nanocapillaries
    Gal, G. A. B.
    Rajta, I.
    Szilasi, S. Z.
    Juhasz, Z.
    Biri, S.
    Cserhati, C.
    Csik, A.
    Sulik, B.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2011, 269 (20): : 2322 - 2325
  • [8] CHANNELING SCANNING-TRANSMISSION ION MICROSCOPY
    CHOLEWA, M
    BENCH, G
    LEGGE, GJF
    SAINT, A
    APPLIED PHYSICS LETTERS, 1990, 56 (13) : 1236 - 1238
  • [9] Scanning Transmission Ion Microscopy of Nanoscale Apertures
    Alves, Andrew D. C.
    van Donkelaar, Jessica
    Rubanov, Sergey
    Reichart, Patrick
    Jamieson, David N.
    Taylor, Michael L.
    Franich, Rick D.
    Johnston, Peter N.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (06) : 3704 - 3708
  • [10] Scanning transmission ion microscopy in Shanghai scanning proton microprobe system
    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
    不详
    Qiangjiguang Yu Lizishu, 2008, 2 (313-318):
12345