Correction of phase drifts in two-wavelength digital holographic microscopy using secondary reference waves

被引：0
|
作者：
Sarbort, Martin [1 ]
Cizek, Martin [1 ]
Pavelka, Jan [1 ]
Lazar, Josef [1 ]
机构：
[1] Czech Acad Sci, Inst Sci Instruments, Kralovopolska 147, Brno 61200, Czech Republic
来源：
EOS ANNUAL MEETING, EOSAM 2024 | 2024年 / 309卷
关键词：
D O I：
10.1051/epjconf/202430902006
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a two-wavelength digital holographic microscopy setup for surface topography measurement with single-point illumination and a method for correction of unwanted phase drifts using secondary reference waves.
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页数：2
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