Correction of phase drifts in two-wavelength digital holographic microscopy using secondary reference waves

被引:0
|
作者
Sarbort, Martin [1 ]
Cizek, Martin [1 ]
Pavelka, Jan [1 ]
Lazar, Josef [1 ]
机构
[1] Czech Acad Sci, Inst Sci Instruments, Kralovopolska 147, Brno 61200, Czech Republic
来源
EOS ANNUAL MEETING, EOSAM 2024 | 2024年 / 309卷
关键词
D O I
10.1051/epjconf/202430902006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a two-wavelength digital holographic microscopy setup for surface topography measurement with single-point illumination and a method for correction of unwanted phase drifts using secondary reference waves.
引用
收藏
页数:2
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