Transient measurements of the excitation efficiency in ZnS-based thin film electroluminescent devices

被引：0

作者：

Zeinert, A. ^{[1
]}

Barthou, Ch. ^{[1
]}

Benalloul, P. ^{[1
]}

Benoit, J. ^{[1
]}

机构：

[1] Universite Pierre et Marie Curie, Paris, France

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 07期

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摘要：

引用

页码：3909 / 3913

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