Transient measurements of the excitation efficiency in ZnS-based thin film electroluminescent devices

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作者：
Zeinert, A. [1 ]
Barthou, Ch. [1 ]
Benalloul, P. [1 ]
Benoit, J. [1 ]
机构：
[1] Universite Pierre et Marie Curie, Paris, France
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 07期
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页码：3909 / 3913
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