Cross-sectional electron microscopy observation on the amorphized indentation region in [001] single-crystal silicon

被引：0
|
作者：
Stt. Key Lab. Fatigue Fracture Mat., Inst. Metal Res., Chinese Acad. S., Shenyang, China [1 ]
不详 [2 ]
机构：
来源：
Acta Mater | / 8卷 / 2431-2436期
关键词：
The authors appreciate the financial support from the National Natural Science Foundation of China (Grant Number: 59671040);
D O I：
暂无
中图分类号：
学科分类号：
摘要：
17
引用
收藏
相关论文
共 50 条
  • [41] Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films
    Chien, Chi-Hui
    Jian, Sheng-Rui
    Wang, Chung-Ting
    Juang, Jenh-Yih
    Huang, J. C.
    Lai, Yi-Shao
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (13) : 3985 - 3990
  • [42] Radial micro-cracks in pile-up region of single-crystal Cu in spherical indentation: experimental observation and crystal plastic simulation
    Zhankun Sun
    Fuguo Li
    Jinmeng Zhu
    Journal of Materials Science, 2019, 54 : 9875 - 9886
  • [43] Radial micro-cracks in pile-up region of single-crystal Cu in spherical indentation: experimental observation and crystal plastic simulation
    Sun, Zhankun
    Li, Fuguo
    Zhu, Jinmeng
    JOURNAL OF MATERIALS SCIENCE, 2019, 54 (13) : 9875 - 9886
  • [44] Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy
    Vilas N. Koinkar
    Bharat Bhushan
    Journal of Materials Research, 1997, 12 : 3219 - 3224
  • [45] Scanning and transmission electron microcopies of single-crystal silicon microworn/machined using atomic force microscopy
    Koinkar, VN
    Bhushan, B
    JOURNAL OF MATERIALS RESEARCH, 1997, 12 (12) : 3219 - 3224
  • [46] Magnetic force microscopy and cross-sectional transmission electron microscopy of carburised surfaces
    Stevens, KJ
    Parbhu, A
    Soltis, J
    CURRENT APPLIED PHYSICS, 2004, 4 (2-4) : 304 - 307
  • [47] ROTATIONAL HYSTERESIS LOSS IN SILICON-IRON SINGLE-CRYSTAL WITH (001) SURFACES
    NARITA, K
    YAMAGUCH.T
    IEEE TRANSACTIONS ON MAGNETICS, 1974, MA10 (02) : 165 - 167
  • [48] DIRECT OBSERVATION OF SCREW DISLOCATIONS PERPENDICULAR TO SURFACE OF SINGLE-CRYSTAL SILICON
    DANILCHUK, LN
    NIKITENK.VI
    SOVIET PHYSICS SOLID STATE,USSR, 1968, 9 (07): : 1592 - +
  • [49] RADIATIVE MODERATION OF AN ELECTRON-BEAM IN A SILICON SINGLE-CRYSTAL
    GUBRIENKO, KI
    MAISHEEV, VA
    MYSNIK, AI
    NURUSHEV, SB
    SOLOVIANOV, VL
    FROLOV, AM
    ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1983, 84 (01): : 40 - 47
  • [50] Small single-crystal silicon cantilevers formed by crystal facets for atomic force microscopy
    Nakagawa, Kazuhisa
    Hashiguchi, Gen
    Kawakatsu, Hideki
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (09):
12345