Defect production in silicon irradiated with 750 MeV Ar ions

被引：0
|
作者：
Zhu, Zhiyong [1 ]
Hou, Mingdong [1 ]
Jin, Yunfan [1 ]
Liu, Changlong [1 ]
Wang, Yinshu [1 ]
Han, Jin [1 ]
机构：
[1] Chinese Acad of Sciences, Lanzhou, China
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1998年 / 135卷 / 1-4期
关键词：
Number:; -; Acronym:; CAS; Sponsor: Chinese Academy of Sciences; Sponsor: China Postdoctoral Science Foundation;
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页码：260 / 264
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