Thermal characterization of a double-gate silicon-on-insulator MOSFET

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作者：
Pandey, Manoj K. [1 ]
Sen, Sujata [1 ]
Gupta, R.S. [1 ]
机构：
[1] Semiconduct. Device Res. Laboratory, Department of Electronic Science, University of Delhi South Campus, New Delhi 110021, India
来源：
Journal of Physics D: Applied Physics | / 32卷 / 03期
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页码：344 / 349
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