Micro-temperature measurements on semiconductor laser mirrors by reflectance modulation: A newly developed technique for laser characterization

被引:0
|
作者
机构
[1] Epperlein, Peter-Wolfgang
来源
Epperlein, Peter-Wolfgang | 1600年 / 32期
关键词
Semiconductor lasers;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] INTENSITY MODULATION TECHNIQUE USING A DIRECTLY FREQUENCY-MODULATED SEMICONDUCTOR-LASER AND AN INTERFEROMETER
    YABRE, G
    LEBIHAN, J
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 1995, 13 (10) : 2093 - 2098
  • [32] Temperature measurements of semiconductor wafers via laser thermometer with fiber optic communication line
    Lukin, O.V.
    Magunov, Alexander N.
    Proceedings of SPIE - The International Society for Optical Engineering, 1994, 2321 : 439 - 442
  • [33] Bulk lifetime and surface recombination measurements on high purity silicon by a laser modulation technique
    Fedortsov, AB
    Letenko, DG
    Churkin, YV
    Tsentsiper, LM
    Vedde, J
    PROCEEDINGS OF THE FOURTH INTERNATIONAL SYMPOSIUM ON HIGH PURITY SILICON, 1996, 96 (13): : 481 - 489
  • [34] TEMPERATURE RISE AND THERMAL RISE-TIME MEASUREMENTS OF A SEMICONDUCTOR-LASER DIODE
    ABDELKADER, HI
    HAUSIEN, HH
    MARTIN, JD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (03): : 2004 - 2007
  • [35] IR-LASER INTERFEROMETRIC THERMOMETRY - A NONINTRUSIVE TECHNIQUE FOR MEASURING SEMICONDUCTOR WAFER TEMPERATURE
    DONNELLY, VM
    MCCAULLEY, JA
    TAHA, I
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 200 : 117 - COLL
  • [36] NONCONTACT MOBILITY MEASUREMENTS WITH A LASER MICROWAVE PHOTOCONDUCTANCE TECHNIQUE - TEMPERATURE-DEPENDENCE
    BUCZKOWSKI, A
    KATAYAMA, K
    ROZGONYI, GA
    SHIMURA, F
    APPLIED PHYSICS LETTERS, 1992, 60 (10) : 1229 - 1231
  • [37] High temperature measurements of ultrasonic wave speed using a laser ultrasonic technique
    Tackitt, KD
    Gillespie, JW
    Caron, JN
    Mehl, JB
    ANTEC '96: PLASTICS - RACING INTO THE FUTURE, VOLS I-III: VOL I: PROCESSING; VOL II: MATERIALS; VOL III: SPACIAL AREAS, 1996, 42 : 1198 - 1202
  • [38] Characterization of a distributed feedback laser with air/semiconductor gratings embedded by the wafer fusion technique
    Imada, M
    Noda, S
    Kobayashi, H
    Sasaki, G
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1999, 35 (09) : 1277 - 1283
  • [39] Application of Laser Videographic Cryoscopic Micro Osmometry in Measurements of Temperature Depression in Petroleum Products
    E. V. Zaitsev
    Chemistry and Technology of Fuels and Oils, 2015, 51 : 79 - 86
  • [40] Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes
    Ochalski, Tomasz J.
    Piwonski, Tomasz
    Wawer, Dorota
    Pierscinski, Kamil
    Bugajski, Maciej
    Kozlowska, Anna
    Malag, Andrzej
    Tomm, Jens W.
    OPTICA APPLICATA, 2005, 35 (03) : 479 - 484