Micro-temperature measurements on semiconductor laser mirrors by reflectance modulation: A newly developed technique for laser characterization

被引:0
|
作者
机构
[1] Epperlein, Peter-Wolfgang
来源
Epperlein, Peter-Wolfgang | 1600年 / 32期
关键词
Semiconductor lasers;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Direct fabrication of Cu/Cu2O composite micro-temperature sensor using femtosecond laser reduction patterning
    Mizoshiri, Mizue
    Ito, Yasuaki
    Arakane, Shun
    Sakurai, Junpei
    Hata, Seiichi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (06)
  • [22] CROSS-PHASE MODULATION IN A SEMICONDUCTOR-LASER AMPLIFIER DETERMINED BY A DISPERSIVE TECHNIQUE
    DIJAILI, SP
    WIESENFELD, JM
    RAYBON, G
    BURRUS, CA
    DIENES, A
    SMITH, JS
    WHINNERY, JR
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1992, 28 (01) : 141 - 150
  • [23] New modulation technique for unambiguous measurements of phase changes in diode laser interferometers
    Koltchanov, I
    Petermann, K
    Roths, J
    OPTICAL INSPECTION AND MICROMEASUREMENTS II, 1997, 3098 : 325 - 333
  • [24] Reflectance and photoluminescence characterization of CdS and CdSe heteroepitaxial films deposited by laser ablation technique
    Perna, G
    Capozzi, V
    Pagliara, S
    Ambrico, M
    Lojacono, D
    THIN SOLID FILMS, 2001, 387 (1-2) : 208 - 211
  • [25] A chip tuneable laser developed for on-line micro-nano scale surface measurements
    Yang, Shuming
    Jiang, Xiangqian
    Maxwell, Graeme
    Wyatt, Richard
    Rogers, Dave
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (10)
  • [26] Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices
    Grauby, S.
    Salhi, A.
    Rampnoux, J.-M.
    Michel, H.
    Claeys, W.
    Dilhaire, S.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (07):
  • [27] CORONARY VENOUS FLOW MEASUREMENTS BY A NEWLY DEVELOPED CATHETER-TYPE LASER DOPPLER-VELOCIMETER
    WADA, Y
    GOTO, M
    TADAOKA, S
    NAKAI, M
    OGASAWARA, Y
    TSUJIOKA, K
    KAJIYA, F
    JAPANESE CIRCULATION JOURNAL-ENGLISH EDITION, 1985, 49 (08): : 834 - 835
  • [28] APPLICATION OF A NEWLY DEVELOPED CCD FOR SPECTRAL-WIDTH MEASUREMENTS OF A 53-EV GERMANIUM LASER
    TSUNEMI, H
    NOMOTO, S
    HAYASHIDA, K
    MIYATA, E
    MURAKAMI, H
    KATO, Y
    YUAN, G
    MURAI, K
    KODAMA, R
    DAIDO, H
    APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1993, 57 (05): : 331 - 336
  • [29] In situ characterization of semiconductor saturable absorber mirrors in an operating Yb:KGW mode-locked laser
    Paunescu, G
    Hein, J
    Sauerbrey, R
    Richter, W
    OPTICS LETTERS, 2005, 30 (20) : 2799 - 2801
  • [30] Laser photo-reflectance characterization of resonant nonlinear electro-refraction in thin semiconductor films
    Chism, Will
    Cartwright, Jason
    THIN SOLID FILMS, 2012, 520 (21) : 6521 - 6524