Two-wavelength interferometry that uses a Fourier-transform method

被引：0

作者：

Onodera, Ribun ^{[1
]}

机构：

[1] Department of Electronics, University of Industrial Technology, Sagamihara, 4-1-1, Sagamihara, Kanagawa 229-1196, Japan

来源：

Applied Optics | 1998年 / 37卷 / 34期

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D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：7988 / 7994

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