Two-wavelength interferometry that uses a Fourier-transform method

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作者：
Onodera, Ribun [1 ]
机构：
[1] Department of Electronics, University of Industrial Technology, Sagamihara, 4-1-1, Sagamihara, Kanagawa 229-1196, Japan
来源：
Applied Optics | 1998年 / 37卷 / 34期
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页码：7988 / 7994
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