Two-wavelength interferometry that uses a Fourier-transform method

被引：0
|
作者：
Onodera, Ribun [1 ]
机构：
[1] Department of Electronics, University of Industrial Technology, Sagamihara, 4-1-1, Sagamihara, Kanagawa 229-1196, Japan
来源：
Applied Optics | 1998年 / 37卷 / 34期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：7988 / 7994
相关论文
共 50 条
  • [1] Two-wavelength interferometry that uses a Fourier-transform method
    Onodera, R
    Ishii, Y
    APPLIED OPTICS, 1998, 37 (34) : 7988 - 7994
  • [2] Two-wavelength interferometry based on a Fourier-transform technique
    Onodera, R
    Ishii, Y
    18TH CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: OPTICS FOR THE NEXT MILLENNIUM, TECHNICAL DIGEST, 1999, 3749 : 430 - 431
  • [3] On the effective wavelength in two-wavelength interferometry
    van Brug, H
    Klaver, RG
    PURE AND APPLIED OPTICS, 1998, 7 (06): : 1465 - 1471
  • [4] On the effective wavelength in two-wavelength interferometry
    Delft Univ of Technology, Delft, Netherlands
    Pure Appl Opt J Eur Opt Soc Part A, 6 (1465-1471):
  • [5] FOURIER-TRANSFORM ALGORITHMS FOR INTERFEROMETRY
    ZIEGLER, H
    INFRARED PHYSICS, 1975, 15 (01): : 19 - 26
  • [6] Study on the Two-wavelength Digital Holography Using Double Fourier Transform
    Shin, Sanghoon
    Jung, Wonki
    Yu, Younghun
    KOREAN JOURNAL OF OPTICS AND PHOTONICS, 2010, 21 (03) : 91 - 96
  • [7] Analysis of two-wavelength holographic interferometry
    Shi, Yongchao
    Du, Ling
    Guangxue Jishu/Optical Technique, 1993, (01): : 32 - 35
  • [8] Two-wavelength lateral shearing interferometry
    Mehta, DS
    Singh, P
    Faridi, MS
    Mirza, S
    Shakher, C
    OPTICAL ENGINEERING, 2005, 44 (08)
  • [9] Synchronous two-wavelength temporal interferometry
    Zhang, Xiaoqiong
    Gao, Zhan
    Qin, Jie
    Li, Guangyu
    Feng, Ziang
    Wang, Shengjia
    8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY: OPTICAL TEST, MEASUREMENT TECHNOLOGY, AND EQUIPMENT, 2016, 9684
  • [10] Reliability of fourier-transform spectral interferometry
    Belabas, N
    Dorrer, C
    Likforman, JP
    Joffre, M
    ULTRAFAST PHENOMENA XII, 2001, 66 : 141 - 143
12345