Preparation and characterization of PZT thin films on CeO2(111)/Si(111) structures

被引：0
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作者：
Sakai, I. [1 ]
Tokumitu, E. [1 ]
Ishiwara, H. [1 ]
机构：
[1] Tokyo Inst of Technology, Yokohama, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 9 B期
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页码：4987 / 4990
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