Extended fine structure in elastically scattered electron spectra. Nature and application to structure analysis

被引：0
|
作者：
Bondarchuk, A.B. [1 ]
Goysa, S.N. [1 ]
Koval, I.F. [1 ]
Mel'nik, P.V. [1 ]
Nakhodkin, N.G. [1 ]
机构：
[1] Kiev State Univ, Kiev, Russia
来源：
Surface Science | 1991年 / 258卷 / 1-3期
关键词：
Semiconductor Materials;
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页码：239 / 246
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