Electromigration failure in Al-Si-1% thin film

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Universidade Federal de Minas Gerais, Belo Horizonte, Brazil ^{[1
]}

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Radiat Eff Defects Solids | / 1 -4 pt 1卷 / 71-79期

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Number:; -; Acronym:; CNPq; Sponsor: Conselho Nacional de Desenvolvimento CientÃfico e TecnolÃ³gico;

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[41] INVESTIGATION OF P-N-JUNCTIONS IN N-SI OBTAINED BY ELECTROMIGRATION OF AL THROUGH A THIN SIO2 FILM
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