Electromigration failure in Al-Si-1% thin film

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Universidade Federal de Minas Gerais, Belo Horizonte, Brazil [1 ]
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Radiat Eff Defects Solids | / 1 -4 pt 1卷 / 71-79期
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Number:; -; Acronym:; CNPq; Sponsor: Conselho Nacional de Desenvolvimento Científico e Tecnológico;
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