Study on nanofabrication with scanning tunneling microscopy

被引：0
|
作者：
Tianjin Univ, Tianjin, China [1 ]
机构：
来源：
Weixi Jiagong Jishu | / 4卷 / 25-29期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
相关论文
共 50 条
  • [31] SCANNING TUNNELING MICROSCOPY
    HANSMA, PK
    TERSOFF, J
    JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23
  • [32] SCANNING TUNNELING MICROSCOPY
    STOLL, E
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1984, 9 (03): : 213 - 216
  • [33] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 355 - 369
  • [34] SCANNING TUNNELING MICROSCOPY
    NISHIKAWA, O
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 92 - 93
  • [35] SCANNING TUNNELING MICROSCOPY
    CHIANG, S
    WILSON, RJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 10 - ANYL
  • [36] SCANNING TUNNELING MICROSCOPY
    EDELMAN, VS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 993 - 1022
  • [37] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    PHYSICA B & C, 1984, 127 (1-3): : 37 - 45
  • [38] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    HELVETICA PHYSICA ACTA, 1982, 55 (06): : 726 - 735
  • [39] SCANNING TUNNELING MICROSCOPY
    GRIFFITH, JE
    KOCHANSKI, GP
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1990, 20 : 219 - 244
  • [40] INTEGRATED NANOFABRICATION WITH THE SCANNING ELECTRON-MICROSCOPE AND SCANNING TUNNELING MICROSCOPE
    ROSOLEN, GC
    HOOLE, ACF
    WELLAND, ME
    BROERS, AN
    APPLIED PHYSICS LETTERS, 1993, 63 (17) : 2435 - 2437
12345