共 50 条
- [24] Hot-carrier reliability of N- and P-channel MOSFETS with polysilicon and CVD tungsten-polycide gate MICROELECTRONICS AND RELIABILITY, 1996, 36 (11-12): : 1663 - 1666
- [26] High energy ion irradiation effects on thin oxide p-channel MOSFETs 2001 6TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2002, : 77 - 84
- [27] FASTER P-CHANNEL MOSFETS MAY BE ON THE WAY ELECTRONIC PRODUCTS MAGAZINE, 1991, 34 (03): : 18 - 18