Electron Backscattering by Thin Layers Deposited on Bulk Substrate.

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作者：
Hohn, F.J.
Kindt, M.
Niedrig, H.
Stuth, B.
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Optik (Jena) | 1976年 / 46卷 / 04期
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摘要：
The backscattering of electrons (20 keV-100 keV) by different top layers on bulk materials has been investigated with respect to the thickness determination of the top layers.
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页码：491 / 500
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