Electron Backscattering by Thin Layers Deposited on Bulk Substrate.

被引：0

作者：

Hohn, F.J.

Kindt, M.

Niedrig, H.

Stuth, B.

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来源：

Optik (Jena) | 1976年 / 46卷 / 04期

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摘要：

The backscattering of electrons (20 keV-100 keV) by different top layers on bulk materials has been investigated with respect to the thickness determination of the top layers.

引用

页码：491 / 500

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