Fault model for VLSI circuits reliability assessment

被引：0
|
作者：
Lisenker, Boris [1 ]
Mitnick, Yuri [1 ]
机构：
[1] Intel Israel, Haifa, Israel
来源：
Annual Proceedings - Reliability Physics (Symposium) | 1999年
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摘要：
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页码：319 / 326
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