Subband signature extraction for fault diagnosis of analog VLSI circuits

被引：0
|
作者：
Xie, Yong-Le [1 ]
Li, Xi-Feng [1 ]
机构：
[1] School of Automation Eng., Univ. of Electronic Sci. and Technol. of China, Chengdu 610054, China
来源：
Sichuan Daxue Xuebao (Gongcheng Kexue Ban)/Journal of Sichuan University (Engineering Science Edition) | 2007年 / 39卷 / 05期
关键词：
VLSI circuits;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：149 / 154
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