Feature extraction approaches in fault diagnosis of analog circuits

被引：0
|
作者：
Liu, Hong
Chen, Guangju
Song, Guoming
Jiang, Shuyan
机构：
[1] School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
[2] School of Computer Science and Technology, Changchun University of Science and Technology, Changchun 130022, China
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2008年 / 29卷 / SUPPL.期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
15
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收藏
页码：244 / 247
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