A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder

被引：0

作者：

Yoshioka, Tadanori ^{[1
]}

Kawasaki, Masahiro ^{[2
]}

Yamamatsu, Junko ^{[3
]}

Nomura, Takeshi ^{[3
]}

Isshiki, Toshiyuki ^{[4
]}

Shiojiri, Makoto ^{[4
]}

机构：

[1] JEOL Datum Inc, Japan

[2] JEOL Co. Ltd, 3-1-2 Musashino, Akishima, Tokyo,196, Japan

[3] Materials Research Center, TDK Co, 570-2 Matsugashita, Minami-hatori, Narita,286, Japan

[4] Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Kyoto,606, Japan

来源：

Microscopy | 1997年 / 46卷 / 04期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：293 / 301

共 50 条

[31] Characterization of thermally stable W/Ni multilayers by X-rays and cross-sectional transmission electron microscopy
Bagchi, Sharmistha
Lalla, N. P.
THIN SOLID FILMS, 2007, 515 (13) : 5227 - 5232
[32] Preparation of cross-sectional transmission electron microscopy specimens of obliquely deposited magnetic thin films on a flexible tape
Keim, EG
Bijker, MD
Lodder, JC
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (04): : 1191 - 1194
[33] A method for preparation of ferromagnetic powder particles single layer for electron and optical microscopy
Dudchenko, A.K.
Grin'ko, I.E.
Kuzema, A.S.
Poroshkovaya Metallurgiya, 1998, (3-4): : 115 - 118
[34] PREPARATION OF TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONS USING NANOFABRICATION TECHNIQUES
YATER, JA
THOMPSON, MO
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (01): : 183 - 186
[35] A CHEMICAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL SAMPLES
GABORIAUD, RJ
JOURNAL OF ELECTRONIC MATERIALS, 1983, 12 (05) : 837 - 844
[36] Cross-sectional transmission electron microscopy of metallographic damage in hollandite nuclear wasteforms
Mitchell, DRG
Attard, DJ
Carter, ML
MATERIALS CHARACTERIZATION, 2002, 48 (04) : 359 - 362
[37] LOCALIZED THINNING OF SEMICONDUCTOR NANOSTRUCTURES FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
VIEU, C
PEPIN, A
BENASSAYAG, G
GIERAK, J
LADAN, FR
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 385 - 390
[38] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON-SILICIDE INTERFACES
FOLL, F
HO, PS
TU, KN
JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) : 250 - 255
[39] Cross-sectional characterization of thin-film transistors with transmission electron microscopy
Tsuji, S.
Tanaka, M.
Iwama, H.
Tsutsui, N.
Kuroda, K.
Saka, H.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1995, 13 (03): : 1353 - 1357
[40] ION MILLING PROCEDURES FOR CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
BULLELIEUWMA, CWT
SURFACE AND INTERFACE ANALYSIS, 1986, 9 (1-6) : 74 - 74

← 1 2 3 4 5 →