共 50 条
- [21] A NEW CROSS-SECTIONAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (03): : 918 - 920
- [22] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY FOR POLYCRYSTALLINE SILICON FILMS JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (JAN): : 97 - 103
- [24] A high-throughput approach for cross-sectional transmission electron microscopy sample preparation of thin films JOURNAL OF ELECTRON MICROSCOPY, 2008, 57 (06): : 189 - 194
- [27] Specific site cross-sectional sample preparation using focused ion beam for transmission electron microscopy PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1998, 36 (1-2): : 99 - 122
- [28] PREPARATION OF CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY SAMPLES BY ELECTRON-BEAM LITHOGRAPHY AND REACTIVE ION ETCHING JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 11 (01): : 62 - 69
- [29] PREPARATION OF FINE WIRE FOR TRANSMISSION ELECTRON MICROSCOPY ASM TRANSACTIONS QUARTERLY, 1965, 58 (03): : 428 - &
- [30] Electron scattering from Si surface and interface by cross-sectional transmission electron microscopy Miyatake, Hiroshi, 1600, JJAP, Minato-ku, Japan (33):