REDISTRIBUTION OF IMPLANTED PHOSPHORUS AFTER PLATINUM SILICIDE FORMATION AND THE CHARACTERISTICS OF SCHOTTKY BARRIER DIODES.

被引:0
|
作者
Kikuchi, Akira [1 ]
Sugaki, Shojiro [1 ]
机构
[1] Central Research Laboratory, Hitachi, Limited, Kokubunji, Tokyo 185, Japan
来源
| 1600年 / 53期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
5
引用
收藏
相关论文
共 50 条
  • [21] EFFECT OF CURRENT FLOW ON THE RELIABILITY OF SCHOTTKY-BARRIER DIODES.
    Zykov, G.A.
    Levandovskiy, V.G.
    Panichevskaya, V.I.
    Panfilova, S.V.
    Chayka, G.Ye.
    1600, (31):
  • [22] INTERFACIAL ANALYSIS OF MoNb-GaAs SCHOTTKY BARRIER DIODES.
    Yu Mingren
    Zhu Furong
    Wang Xun
    Wang Binqi
    Shao Kai
    Bu Jishan
    Lei Chuanren
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1985, 6 (01): : 55 - 60
  • [24] THE SCHOTTKY-BARRIER HEIGHT OF PLATINUM NICKEL SILICIDE
    ELLWANGER, RC
    MORGAN, AE
    STACY, WT
    TAMMINGA, Y
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03): : 533 - 539
  • [25] Electrical and Dielectric Characteristics of Al/Polyindole Schottky Barrier Diodes. II. Frequency Dependence
    Yeriskin, Seckin Altindal
    Unal, H. Ibrahim
    Sari, Bekir
    JOURNAL OF APPLIED POLYMER SCIENCE, 2011, 120 (01) : 390 - 396
  • [26] PHOSPHORUS REDISTRIBUTION DURING NICKEL SILICIDE FORMATION
    KIKUCHI, A
    JOURNAL OF APPLIED PHYSICS, 1988, 64 (02) : 938 - 940
  • [28] CURRENT TRANSPORT MECHANISM OF HYDROGENATED AMORPHOUS SILICON SCHOTTKY BARRIER DIODES.
    Mishima, Yasuyoshi
    Hirose, Masataka
    Osaka, Yukio
    1600, (20):
  • [29] Electron transport and barrier inhomogeneities in palladium silicide Schottky diodes
    Chand, S
    Kumar, J
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 65 (4-5): : 497 - 503
  • [30] ANALYSIS OF FREQUENCY MULTIPLIERS CONSTRUCTED FROM SCHOTTKY-BARRIER DIODES.
    Grunenkov, A.A.
    Kalinin, B.V.
    Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika), 1982, 36-37 (10): : 79 - 81