EFFECT OF THE COMMON PROCESS NOISE ON THE TWO-SENSOR FUSED-TRACK COVARIANCE.
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作者:
Bar-Shalom, Yaakov
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Univ of Connecticut, Storrs, CT, USA, Univ of Connecticut, Storrs, CT, USAUniv of Connecticut, Storrs, CT, USA, Univ of Connecticut, Storrs, CT, USA
Bar-Shalom, Yaakov
[1
]
Campo, Leon
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Univ of Connecticut, Storrs, CT, USA, Univ of Connecticut, Storrs, CT, USAUniv of Connecticut, Storrs, CT, USA, Univ of Connecticut, Storrs, CT, USA
Campo, Leon
[1
]
机构:
[1] Univ of Connecticut, Storrs, CT, USA, Univ of Connecticut, Storrs, CT, USA
SIGNAL FILTERING AND PREDICTION - Mathematical Models;
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摘要:
A procedure to fuse state estimates of the same target obtained from different sensors is presented. This procedure accounts for the fact that such estimates have dependent errors due to the common process noise. An example in which estimates obtained from two alpha - beta filters were fused indicates that the uncertainty area corresponding to the fused estimates is about 70% of the single-sensor uncertainty area over a wide range of the process noise variance. This is in contrast to the 50% obtained if the dependence is not accounted for.
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Park, Sang-Hui
Lee, Sang-Han
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Lee, Sang-Han
Park, Se-Hong
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Park, Se-Hong
Sohn, Yeong-Hoon
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Sohn, Yeong-Hoon
Huh, Yeunhee
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Huh, Yeunhee
Choi, Gyu-Hyeong
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Korea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Choi, Gyu-Hyeong
Rim, Chun-Taek
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Korea Adv Inst Sci & Technol, GIST, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South KoreaKorea Adv Inst Sci & Technol, 4222,E3-2,291 Daehak Ro, Daejeon 34141, South Korea
Rim, Chun-Taek
2017 INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC),
2017,
机构:
Denso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan
Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, JapanDenso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan
Maeno, Tsuyoshi
Sakurai, Yukihiko
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Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, JapanDenso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan
Sakurai, Yukihiko
Unou, Takanori
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Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, JapanDenso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan
Unou, Takanori
Ichikawa, Kouji
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机构:
Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, JapanDenso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan