Slit effect of common ground patterns in affecting cross-talk noise between two parallel signal traces on printed circuit boards

被引：2
|
作者：
Maeno, Tsuyoshi [1 ,2 ]
Sakurai, Yukihiko [2 ]
Unou, Takanori [2 ]
Ichikawa, Kouji [2 ]
Fujiwara, Osamu [2 ]
机构：
[1] Denso Corporation, 1-1, Showa-cho, Kariya 448-8661, Japan
[2] Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
来源：
IEEJ Transactions on Fundamentals and Materials | 2008年 / 128卷 / 11期
关键词：
D O I：
10.1541/ieejfms.128.657
中图分类号：
学科分类号：
摘要：
12
引用
收藏
页码：657 / 662
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